COMPARISON OF MONTE CARLO AND HYDRODYNAMIC MODEL IN ELECTRON TRANSPORT CHARACTERISTICS OF ZnO DIODE Author(s):H. Arabshahi and M. Rezaee Rokn-Abadi AbstractDownload article Pages 1-9
QOS RELIABILITY AND IMPROVEMENT FOR CONGESTION PROBABILITY ROUTING IN ATM NETWORKS Author(s):P. Rajan and Arul Lawrence Selvakumar AbstractDownload article Pages 11-19
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MODELING OF A 6H-SiC MESFET FOR HIGH-POWER AND HIGH-GAIN APPLICATIONS Author(s): H. Arabshahi and M. Rezaee Rokn-Abadi AbstractDownload article Pages 31-38
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